scanning electron microscopy (SEM) -> ηλεκτρονική μικροσκοπία σάρωσης (ΗΜΣ)

spiros

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Scanning Electron Microscopy (SEM) -> ηλεκτρονική μικροσκοπία σάρωσης

The scanning electron microscope (SEM) is a type of electron microscope that images the sample surface by scanning it with a high-energy beam of electrons in a raster scan pattern. The electrons interact with the atoms that make up the sample producing signals that contain information about the sample's surface topography, composition and other properties such as electrical conductivity.

The types of signals made by an SEM can include secondary electrons, back scattered electrons, characteristic x-rays and light (cathodoluminescence). These signals come from the beam of electrons striking the surface of the specimen and interacting with the sample at or near its surface. In its primary detection mode, secondary electron imaging, the SEM can produce very high-resolution images of a sample surface, revealing details about 1 to 5 nm in size. Due to the way these images are created, SEM micrographs have a very large depth of focus yielding a characteristic three-dimensional appearance useful for understanding the surface structure of a sample. This great depth of field and the wide range of magnifications (commonly from about 25 times to 250,000 times) are available in the most common imaging mode for specimens in the SEM, secondary electron imaging, such as the micrograph taken of pollen shown to the right. Characteristic x-rays are the second most common imaging mode for an SEM. X-rays are emitted when the electron beam removes an inner shell electron from the sample, causing a higher energy electron to fill the shell and give off energy. These characteristic x-rays are used to identify the elemental composition of the sample. Back-scattered electrons (BSE) that come from the sample may also be used to form an image. BSE images are often used in analytical SEM along with the spectra made from the characteristic x-rays as clues to the elemental composition of the sample.
https://en.wikipedia.org/wiki/Scanning_electron_microscope
« Last Edit: 03 Nov, 2013, 11:00:49 by spiros »


 

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