transmission electron microscopy (TEM) -> ηλεκτρονική μικροσκοπία μετάδοσης, ηλεκτρονική μικροσκοπία διείσδυσης, ηλεκτρονική μικροσκοπία διέλευσης

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Transmission Electron Microscopy (TEM) -> ηλεκτρονική μικροσκοπία μετάδοσης, ηλεκτρονική μικροσκοπία διείσδυσης

Transmission electron microscopy (TEM) is a microscopy technique whereby a beam of electrons is transmitted through an ultra thin specimen, interacting with the specimen as it passes through it. An image is formed from the electrons transmitted through the specimen, magnified and focused by an objective lens and appears on an imaging screen, a fluorescent screen in most TEMs, plus a monitor, or on a layer of photographic film, or to be detected by a sensor such as a CCD camera. The first practical transmission electron microscope was built by Albert Prebus and James Hillier at the University of Toronto in 1938 using concepts developed earlier by Max Knoll and Ernst Ruska.
Transmission electron microscopy - Wikipedia, the free encyclopedia

« Last Edit: 14 Apr, 2014, 14:26:13 by spiros »


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